Steganalysis Using Color Wavelet Statistics and One-Class Support Vector Machines

Siwei Lyu and Hany Farid

SPIE Symposium on Electronic Imaging, San Jose, CA, 2004

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Steganographic messages can be embedded into digital images in ways that are imperceptible to the human eye. These messages, however, alter the underlying statistics of an image. We previously built statistical models using first-and higher-order wavelet statistics, and employed a non-linear support vector machines (SVM) to detect steganographic messages. In this paper we extend these results to exploit color statistics, and show how a one-class SVM greatly simplifies the training stage of the classifier.