Higher-Order Wavelet Statistics and their Application to Digital Forensics

Hany Farid and Siwei Lyu

IEEE Workshop on Statistical Analysis in Computer Vision (in conjunction with CVPR), Madison, Wisconsin, 2003

Paper (pdf) bibtex

We describe a statistical model for natural images that is built upon a multi-scale wavelet decomposition. The model consists of first- and higher-order statistics that capture certain statistical regularities of natural images. We show how this model can be useful in several digital forensic applications, specifically in detecting various types of digital tampering.